Teseq Inc. has released the new NSG 3060 test generator featuring an innovative design that uses modular architecture to provide system configurations meeting the needs of basic and sophisticated test laboratories. Teseq’s new NSG 3060 conducted immunity generator takes the proven, user-friendly design of the highly successful Modula series to a new level. This innovative design uses modular architecture to provide a versatile system that can be confi gured for basic testing needs and expanded to meet the needs of sophisticated test laboratories.

    The generator's user-friendly interface is complete with a 7" high-contrast, color touch-screen and superb graphics, which enable quick set-up of test procedures. New pulse generator modules can be added to the original system confi guration quickly and easily with the NSG 3060’s unique “Master-Slave” concept. This technology allows individual pulse modules to be calibrated separately with the calibration data and correction factors stored on the slave controller. New modules are simply installed with no need to return the entire system for calibration.

    The multi-functional NSG 3060 provides a surge voltage of up to 6.6 kV for testing of combination wave, ring wave, EFT pulses as well as burst, dip/interrupt and magnetic field applications. The generator's powerful processors satisfy the unique coupling requirements specified by ANSI C62.41, making the system compatible with both ANSI and IEC coupling methods. The NSG 3060 also meets the requirements for CE Marking. The system's unique "master-slave" concept enables new pulse generator modules to be quickly added to the original system configuration.

    This feature allows for individual pulse modules to be calibrated separately with the calibration data and correction factors to be stored on the slave controller. Modules can also be simply installed without the user having to return the system for calibration. The generator's touch panel display enables the creation of multi-step test procedures, programming of ramp functions and easy changes to sequence or parameter values. To effectively activate critical threshold values during a test, the selection of "Expert Mode" allows the user to make a manual parameter change by simply using the thumbwheel.

    Standardized tests can be triggered with a few clicks using the integrated Direct Test Access function. For ease of use, the generator also offers inputs supported by an integrated keyboard or thumbwheel with additional keys for sensitivity adjustment. With the use of a secure digital (SD) memory card reader, firmware downloads are performed quickly and tests specified by the user are saved in full for future reference. A commercial SD memory card can be used for additional storage space and existing test files can be easily copied onto a larger SD card.

    The most striking change in the new NSG 3060 series is the integration of a large 7” touch panel display which has superb contrast and color. Depending on requirements, the inputs are supported by an integrated keyboard, or by using a thumb wheel with additional keys for sensitivity adjustment. The user-friendly graphic display speeds test setup. Each parameter’s value is highly visible and all settings can be quickly selected and modifi ed with the generously sized touch input buttons. A stylus is not necessary, and ramp functions are programmed quickly and easily. Multi-step test procedures can be created and their sequence or parameter values changed easily.